3rd Midwest Imaging and Microanalysis Workshop at Notre Dame
New Trends in In-situ and High Resolution Electron Microscopy for Nanotechnology, Materials and Bio-Sciences
Tuesday, May 17th and Wednesday, May 18th, 2016
Location: McKenna Hall – Room 210-214 (lectures) and Stinson-Remick Hall, Room B03 (TEM demo sessions).
Contact for workshop info: Email: Theresa.Bollinger.email@example.com, Ph: 1 (574) 631-8251
1st day: May 17th, 2015
8:30 am Registration, Demo sign-up, Poster set-up (McKenna Hall, Upper Atrium).
Session 1. Chair: Sergei Rouvimov (McKenna Hall – Room 210-214)
9:00 – 9:05 am Welcome to Notre Dame, Peter Kilpatrick, Dean of College of Engineering
9:05 – 9:10 am Opening: Bradley Smith, Director, NDIIF
9:10 – 9:40 am “TEM study of phase transformation and 3D XEDS tomography” Robert Williams and David McComb, Ohio State University
9:40 – 10:10 am “In-situ TEM Study of Materials under Compression”, Kai Sun, University of Michigan
10:10 – 10:40 am “In situ nano-diffraction from liquids using a high-speed direct electron camera”, Pei Zhang & Paul Voyles, University of Wisconsin Madison
10:40 – 11:00 am COFFEE BREAK
Session 2. Chair: Alex Mukasyan (McKenna Hall – room 210 – 214)
11:00 –11:30 am “Emerging Technologies for Analytical in situ TEM”, John Damiano, Protochip
11:30 – 12:00 noon “Using minimal dose to get the maximum information from samples”, Jan Ringnalda, FEI, Inc.
12:00 – 12:30 pm “In-Situ and Operando TEM Investigation of Catalyst Nanoparticles”, Ben Miller, GATAN
12:30 – 1:00 pm “In situ TEM as a powerful tool for material characterization”, Marina Zakhozheva, DENS Solutions, Inc
1:00 -2:30 pm LUNCH and POSTER SESSION (McKenna Hall –Posters – Upper Atrium
Luncheon – CDA)
2:15 pm-2:30 pm Awards and Prizes announcement
Session 3. Chairs: Matt Leevy and Bradley Smith (McKenna Hall – room 200-204)
2:30 pm-2:45 pm NDIIF Award Winner 1 – EM for Bio Application (TBD)
2:45 pm-3:00 pm NDIIF Award Winner 2 – EM for Materials Application (TBD)
3:00 pm-3:30 pm “Characterizing working catalysts with electron and photon probes”, Eric Stach, Brookhaven National Laboratory
3:30 pm- 4:00 pm “Microstructural Evolution in Transition-metal-oxide Cathode Materials for Lithium-Ion Batteries”, Dean Miller, Argonne National Laboratory
4:00 pm- 4:20 pm “Tomography: What you see depends on how deep you go”, Mark Kelsey, Bruker
4:20 pm- 4:40 pm “Utilizing TEM Sputtered Solid-state Sub-nanometer Pore to Detect the Sequence of Amino Acid Quadromers in Protein Molecules”, Zhuxin Dong and Gregory Timp, Notre Dame.
4:40-5:10 pm MWIM and NDIIF Business meeting
6:00 pm DINNER for speakers - The Mark Dine & Tap
1234 Eddy Street, Suite 111, South Bend, IN 46617
2nd Day: May 18th, 2016 In-situ TEM Demo Session (Stinson-Remick Hall, Rooms B03).
9:00 am – 12:00 noon Demonstration of Heating/Biasing holder, Marina Zakhozheva, DENS Solutions
12:00-1:00 pm Lunch/Discussion Female Students in Microscopy: pursuing a career in TEM research, Mina Asghariheidarlou, NDEMC President, and Marina Zakhozheva, DENS Solutions
1:00 pm – 5:00 pm Demonstration of Heating/Biasing holder (cont.), Marina Zakhozheva, DENS Solutions
Note: A detailed schedule will be provided at the registration.
For additional workshop information and campus map visit: http://ndiif.nd.edu
Sponsors: FEI, Gatan, Bruker, Protochip, DENS, NDIIF, ND Research Office, FEI, ND Energy, ND Nano, EE department, CBE department, ND College of Engineering
Originally published at conductorshare.nd.edu.