3rd Midwest Imaging and Microanalysis Workshop at Notre Dame


Location: McKenna Hall – Room 210-214 (lectures) and Stinson-Remick Hall, Room B03 (TEM demo sessions)

3rd Midwest Imaging and Microanalysis Workshop at Notre Dame


New Trends in In-situ and High Resolution Electron Microscopy for Nanotechnology, Materials and Bio-Sciences

Tuesday, May 17th and Wednesday, May 18th, 2016


Location: McKenna Hall – Room 210-214 (lectures) and Stinson-Remick Hall, Room B03 (TEM demo sessions).

Contact for workshop info: Email: Theresa.Bollinger.1@nd.edu, Ph: 1 (574) 631-8251



1st day: May 17th, 2015

8:30 am Registration, Demo sign-up, Poster set-up (McKenna Hall, Upper Atrium).


Session 1. Chair: Sergei Rouvimov  (McKenna Hall – Room 210-214)


9:00 – 9:05 am Welcome to Notre Dame, Peter Kilpatrick, Dean of College of Engineering

9:05 – 9:10 am Opening: Bradley Smith, Director, NDIIF

9:10 – 9:40 am “TEM study of phase transformation and 3D XEDS tomography” Robert Williams and David McComb, Ohio State University

9:40 – 10:10 am “In-situ TEM Study of Materials under Compression”, Kai Sun, University of Michigan

10:10 – 10:40 am “In situ nano-diffraction from liquids using a high-speed direct electron camera”, Pei Zhang & Paul Voyles, University of Wisconsin Madison


10:40 – 11:00 am COFFEE BREAK


Session 2. Chair: Alex Mukasyan  (McKenna Hall – room 210 – 214)


11:00 –11:30 am “Emerging Technologies for Analytical in situ TEM”, John Damiano, Protochip

11:30 – 12:00 noon “Using minimal dose to get the maximum information from samples”, Jan Ringnalda, FEI, Inc.

12:00 – 12:30 pm “In-Situ and Operando TEM Investigation of Catalyst Nanoparticles”, Ben Miller, GATAN

12:30 – 1:00 pm “In situ TEM as a powerful tool for material characterization”, Marina Zakhozheva, DENS Solutions, Inc

1:00 -2:30 pm LUNCH and POSTER SESSION (McKenna Hall –Posters – Upper Atrium

                                                                                   Luncheon – CDA)

2:15 pm-2:30 pm Awards and Prizes announcement


Session 3. Chairs: Matt Leevy and Bradley Smith  (McKenna Hall – room 200-204)


2:30 pm-2:45 pm NDIIF Award Winner 1 – EM for Bio Application (TBD)

2:45 pm-3:00 pm NDIIF Award Winner 2 – EM for Materials Application (TBD)

3:00 pm-3:30 pm “Characterizing working catalysts with electron and photon probes”, Eric Stach, Brookhaven National Laboratory

3:30 pm- 4:00 pm “Microstructural Evolution in Transition-metal-oxide Cathode Materials for Lithium-Ion Batteries”, Dean Miller, Argonne National Laboratory

4:00 pm- 4:20 pm “Tomography:  What you see depends on how deep you go”, Mark Kelsey, Bruker

4:20 pm- 4:40 pm “Utilizing TEM Sputtered Solid-state Sub-nanometer Pore to Detect the Sequence of Amino Acid Quadromers in Protein Molecules”, Zhuxin Dong and Gregory Timp, Notre Dame.


4:40-5:10 pm MWIM and NDIIF Business meeting


6:00 pm DINNER for speakers -      The Mark Dine & Tap

                                                            1234 Eddy Street, Suite 111, South Bend, IN  46617

                                                            Phone:  574-204-2767


2nd  Day: May 18th, 2016  In-situ TEM Demo Session (Stinson-Remick Hall, Rooms B03).

9:00 am – 12:00 noon Demonstration of Heating/Biasing holder, Marina Zakhozheva, DENS Solutions

12:00-1:00 pm Lunch/Discussion Female Students in Microscopy: pursuing a career in TEM research, Mina Asghariheidarlou, NDEMC President, and Marina Zakhozheva, DENS Solutions

1:00 pm – 5:00 pm Demonstration of Heating/Biasing holder (cont.), Marina Zakhozheva, DENS Solutions


Note: A detailed schedule will be provided at the registration.                                                              

For additional workshop information and campus map visit:  http://ndiif.nd.edu


Sponsors: FEI, Gatan, Bruker, Protochip, DENS, NDIIF, ND Research Office, FEI, ND Energy, ND Nano, EE department, CBE department, ND College of Engineering

Originally published at conductorshare.nd.edu.